Neutron cross-section of N-modular redundancy technique in SRAM-based FPGAs

Jimmy Tarrillo; Fernanda Lima Kastensmidt; Paolo Rech; Christopher Frost; Carlos Valderrama

doi:10.1109/TNS.2014.2343259

Neutron cross-section of N-modular redundancy technique in SRAM-based FPGAs

Jimmy Tarrillo
, Fernanda Lima Kastensmidt
, Paolo Rech
, Christopher Frost
, Carlos Valderrama

Producción científica: Contribución a una revista › Artículo › revisión exhaustiva

11 Citas (Scopus)

Resumen

In this paper the fault-masking capability of N-modular redundancy systems synthesized into SRAM-based FPGAs is evaluated. In the proposed N-modular technique an original self-adaptive majority voter elects the outputs of the redundant modules. Experimentally evaluated neutron cross-section, area, and power consumption were analyzed for different numbers of redundant modules, ranging from 3 copies (standard TMR) up to 7 copies.

Idioma original	Inglés
Número de artículo	6870672
Páginas (desde-hasta)	1558-1566
Número de páginas	9
Publicación	IEEE Transactions on Nuclear Science
Volumen	61
N.º	4
DOI	https://doi.org/10.1109/TNS.2014.2343259
Estado	Publicada - ago. 2014
Publicado de forma externa	Sí

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abstract = "In this paper the fault-masking capability of N-modular redundancy systems synthesized into SRAM-based FPGAs is evaluated. In the proposed N-modular technique an original self-adaptive majority voter elects the outputs of the redundant modules. Experimentally evaluated neutron cross-section, area, and power consumption were analyzed for different numbers of redundant modules, ranging from 3 copies (standard TMR) up to 7 copies.",

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AU - Frost, Christopher

AU - Valderrama, Carlos

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Neutron cross-section of N-modular redundancy technique in SRAM-based FPGAs

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