TY - GEN
T1 - Neutron cross-section of N-modular redundancy technique in SRAM-based FPGAs
AU - Tarrillo, Jimmy
AU - Kastensmidt, Fernanda Lima
AU - Rech, Paolo
AU - Frost, Christopher
AU - Valderrama, Carlos
N1 - Publisher Copyright:
© 2013 IEEE.
PY - 2013/10/28
Y1 - 2013/10/28
N2 - This paper evaluates different trade-offs of N-modular redundancy technique in SRAM-based FPGAs. Redundant copies of the same module were implemented and the outputs voted by self-adapted majority voter. The redundant design was exposed to neutrons and the error rate was evaluated. Results in cross-section, area and power consumption were analyzed for different numbers of redundant modules, ranging from 3 copies (standard TMR) up to 7 copies.
AB - This paper evaluates different trade-offs of N-modular redundancy technique in SRAM-based FPGAs. Redundant copies of the same module were implemented and the outputs voted by self-adapted majority voter. The redundant design was exposed to neutrons and the error rate was evaluated. Results in cross-section, area and power consumption were analyzed for different numbers of redundant modules, ranging from 3 copies (standard TMR) up to 7 copies.
KW - Fault tolerance
KW - N-modular redundancy
KW - SRAM-based FPGAs
UR - http://www.scopus.com/inward/record.url?scp=84949925293&partnerID=8YFLogxK
U2 - 10.1109/RADECS.2013.6937377
DO - 10.1109/RADECS.2013.6937377
M3 - Conference contribution
AN - SCOPUS:84949925293
T3 - Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
BT - Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2013 14th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2013
Y2 - 23 September 2013 through 27 September 2013
ER -