TY - JOUR
T1 - Neutron cross-section of N-modular redundancy technique in SRAM-based FPGAs
AU - Tarrillo, Jimmy
AU - Kastensmidt, Fernanda Lima
AU - Rech, Paolo
AU - Frost, Christopher
AU - Valderrama, Carlos
PY - 2014/8
Y1 - 2014/8
N2 - In this paper the fault-masking capability of N-modular redundancy systems synthesized into SRAM-based FPGAs is evaluated. In the proposed N-modular technique an original self-adaptive majority voter elects the outputs of the redundant modules. Experimentally evaluated neutron cross-section, area, and power consumption were analyzed for different numbers of redundant modules, ranging from 3 copies (standard TMR) up to 7 copies.
AB - In this paper the fault-masking capability of N-modular redundancy systems synthesized into SRAM-based FPGAs is evaluated. In the proposed N-modular technique an original self-adaptive majority voter elects the outputs of the redundant modules. Experimentally evaluated neutron cross-section, area, and power consumption were analyzed for different numbers of redundant modules, ranging from 3 copies (standard TMR) up to 7 copies.
KW - Fault tolerance
KW - N-modular redundancy
KW - SRAM-based FPGAs
UR - http://www.scopus.com/inward/record.url?scp=84906782937&partnerID=8YFLogxK
U2 - 10.1109/TNS.2014.2343259
DO - 10.1109/TNS.2014.2343259
M3 - Article
AN - SCOPUS:84906782937
SN - 0018-9499
VL - 61
SP - 1558
EP - 1566
JO - IEEE Transactions on Nuclear Science
JF - IEEE Transactions on Nuclear Science
IS - 4
M1 - 6870672
ER -