Flexible waveguide coupling probe for wafer-level optical characterization of planar lightwave circuits

Abdullah J. Zakariya, Tao Liu, Julien G. Noel, Roberto R. Panepucci

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

1 Cita (Scopus)

Resumen

A probe that enables optical coupling to planar lightwave circuits (PLCs) is described. A flexible waveguide is used to form a variable length directional coupler that extracts light from a waveguide in the wafer to the probe. Varying the length enables optimal coupling to be achieved for a wide range of probe-to-waveguide gap, materials, widths and cladding thicknesses present on a chip. In this paper we consider the use of SU-8 polymer as waveguide test probe and polydimethylsiloxane (PDMS) as cladding for the probe. The results indicate that this approach is ideal for characterizing PLC's as the 3dB bandwidth of the probe covers the whole 1300 -1700 nm fiber-optic telecommunication range. Coupling length control in the range of 50-200 mm leads to maximum coupling in excess of 80% for the range of conditions investigated.

Idioma originalInglés
Título de la publicación alojada2007 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference, IMOC
Páginas458-461
Número de páginas4
DOI
EstadoPublicada - 2007
Publicado de forma externa
Evento2007 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference, IMOC - Salvador, Brasil
Duración: 29 ene. 20071 nov. 2007

Serie de la publicación

NombreSBMO/IEEE MTT-S International Microwave and Optoelectronics Conference Proceedings

Conferencia

Conferencia2007 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference, IMOC
País/TerritorioBrasil
CiudadSalvador
Período29/01/071/11/07

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