TY - JOUR
T1 - Analyzing the effects of TID in an embedded system running in a flash-based FPGA
AU - Tarrillo, Jimmy
AU - Azambuja, José Rodrigo
AU - Kastensmidt, Fernanda Lima
AU - Fonseca, Evaldo Carlos Pereira
AU - Galhardo, Rafael
AU - Goncalez, Odair
N1 - Funding Information:
Manuscript received July 22, 2011; revised September 08, 2011, September 25, 2011; accepted September 25, 2011. Date of publication November 10, 2011; date of current version December 14, 2011. This work was supported in part by the Brazilian Agencies CNPq and CAPES.
PY - 2011/12
Y1 - 2011/12
N2 - This work analyzes the behavior of a designed embedded system composed of microprocessor, memories and SpaceWire (SpW) links under Total Ionizing Dose (TID) synthesized into a commercial flash-based FPGA from Actel. Two tests were performed: one the FPGA is configured just once at the beginning of the irradiation and the other the FPGA is reconfigured every 5 krad (Si). Results evaluate power supply current (Icc), temperature, function operation and performance degradation.
AB - This work analyzes the behavior of a designed embedded system composed of microprocessor, memories and SpaceWire (SpW) links under Total Ionizing Dose (TID) synthesized into a commercial flash-based FPGA from Actel. Two tests were performed: one the FPGA is configured just once at the beginning of the irradiation and the other the FPGA is reconfigured every 5 krad (Si). Results evaluate power supply current (Icc), temperature, function operation and performance degradation.
KW - Embedded system
KW - Flash-based FPGA
KW - radiation effects
KW - system on chip
KW - total ionizing dose
UR - http://www.scopus.com/inward/record.url?scp=83855163504&partnerID=8YFLogxK
U2 - 10.1109/TNS.2011.2170855
DO - 10.1109/TNS.2011.2170855
M3 - Article
AN - SCOPUS:83855163504
SN - 0018-9499
VL - 58
SP - 2855
EP - 2862
JO - IEEE Transactions on Nuclear Science
JF - IEEE Transactions on Nuclear Science
IS - 6 PART 1
M1 - 6075302
ER -