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An improved 1D diode model for the accurate modeling of parasitics in silicon modulators

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

2 Citas (Scopus)

Resumen

Silicon modulators paved the way for silicon photonics to take control of optical interconnects. Since its popularization, most works use the 1-D diode model approximation to design the horizontal PN junction, which estimates the modulator bandwidth and efficiency. Some works do not even consider the effects of fringe capacitance, alleging that the junction's dimensions are large. The 1-D model is suitable for vertically uniform PN junctions. However, there are essential deviations for the typical rib waveguide used in most horizontal-junction silicon modulators. Our work aims to quantify such deviations incorporating details from 2D model simulations and offer a corrected 1-D model for estimating modulation bandwidth. This study was carried out as follows: Firstly, we incorporated an improved scheme for phase shifting and loss for different junction locations and widely used doping concentrations. Next, we analyzed the generation-recombination effects and their impact on the depletion width at the top and bottom of the waveguide. We calculated the depletion width via the 1-D model and the two-dimensional Poisson's equation finite-element calculation for the rib and identified an important mismatch. Lastly, we propose and demonstrate an accurate equivalent circuit with our 1-D model corrections. Our model considers the total depletion capacitance, the fringe capacitance, the capacitance due to the wider depletion widths at the top and bottom surfaces of the diode, and other capacitive effects at the border of the rib as a result of high reverse bias. We found that although the 1-D model is well-suited for small reverse biases, higher voltages and extreme junction locations affect the bandwidth's estimation dramatically.

Idioma originalInglés
Título de la publicación alojadaSilicon Photonics XVI
EditoresGraham T. Reed, Andrew P. Knights
EditorialSPIE
ISBN (versión digital)9781510642171
DOI
EstadoPublicada - 2021
Publicado de forma externa
EventoSilicon Photonics XVI 2021 - Virtual, Online, Estados Unidos
Duración: 6 mar. 202111 mar. 2021

Serie de la publicación

NombreProceedings of SPIE - The International Society for Optical Engineering
Volumen11691
ISSN (versión impresa)0277-786X
ISSN (versión digital)1996-756X

Conferencia

ConferenciaSilicon Photonics XVI 2021
País/TerritorioEstados Unidos
CiudadVirtual, Online
Período6/03/2111/03/21

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