TY - GEN
T1 - Using electromagnetic emanations for variability characterization in Flash-based FPGAs
AU - Tarrillo, Jimmy
AU - Tonfat, Jorge
AU - Kastensmidt, Fernanda
AU - Reis, Ricardo
AU - Bruguier, Florent
AU - Bourrée, Morgan
AU - Benoit, Pascal
AU - Torres, Lionel
PY - 2013
Y1 - 2013
N2 - An ElectroMagnetic analysis (EMA) technique is applied to Flash-based FPGA (Field Programmable Gate Arrays) ProASIC3E to measure the delay variability. Measurements show that delay variations can reach 40% according to the mapping, placement and routing used in the FPGA array, while the synthesis tool analysis show differences lower than 7%. Comparisons between the use of EMA technique in Flash and SRAM-based FPGAs are presented. The Flash-based FPGA configurable blocks and routing structures are modeled at the electrical level. Then, SPICE simulations are performed to compare the predictive variability to the measurements ones. Results obtained with EMA can support designers on selecting different parts of the FPGA array, such as distinct mapping, placements and routing wires according to application and provide a valuable feedback for the FPGA's manufacture company.
AB - An ElectroMagnetic analysis (EMA) technique is applied to Flash-based FPGA (Field Programmable Gate Arrays) ProASIC3E to measure the delay variability. Measurements show that delay variations can reach 40% according to the mapping, placement and routing used in the FPGA array, while the synthesis tool analysis show differences lower than 7%. Comparisons between the use of EMA technique in Flash and SRAM-based FPGAs are presented. The Flash-based FPGA configurable blocks and routing structures are modeled at the electrical level. Then, SPICE simulations are performed to compare the predictive variability to the measurements ones. Results obtained with EMA can support designers on selecting different parts of the FPGA array, such as distinct mapping, placements and routing wires according to application and provide a valuable feedback for the FPGA's manufacture company.
KW - Electromagnetic Analysis
KW - FPGA
KW - Flash
KW - Variability
UR - https://www.scopus.com/pages/publications/84893523701
U2 - 10.1109/ISVLSI.2013.6654631
DO - 10.1109/ISVLSI.2013.6654631
M3 - Conference contribution
AN - SCOPUS:84893523701
SN - 9781479913312
T3 - Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI
SP - 109
EP - 114
BT - Proceedings - 2013 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2013
PB - IEEE Computer Society
T2 - 2013 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2013
Y2 - 5 August 2013 through 7 August 2013
ER -