Neutron cross-section of N-modular redundancy technique in SRAM-based FPGAs

Jimmy Tarrillo; Fernanda Lima Kastensmidt; Paolo Rech; Christopher Frost; Carlos Valderrama

doi:10.1109/TNS.2014.2343259

Neutron cross-section of N-modular redundancy technique in SRAM-based FPGAs

Jimmy Tarrillo
, Fernanda Lima Kastensmidt
, Paolo Rech
, Christopher Frost
, Carlos Valderrama

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

In this paper the fault-masking capability of N-modular redundancy systems synthesized into SRAM-based FPGAs is evaluated. In the proposed N-modular technique an original self-adaptive majority voter elects the outputs of the redundant modules. Experimentally evaluated neutron cross-section, area, and power consumption were analyzed for different numbers of redundant modules, ranging from 3 copies (standard TMR) up to 7 copies.

Original language	English
Article number	6870672
Pages (from-to)	1558-1566
Number of pages	9
Journal	IEEE Transactions on Nuclear Science
Volume	61
Issue number	4
DOIs	https://doi.org/10.1109/TNS.2014.2343259
State	Published - Aug 2014
Externally published	Yes

Keywords

Fault tolerance
N-modular redundancy
SRAM-based FPGAs

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10.1109/TNS.2014.2343259

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abstract = "In this paper the fault-masking capability of N-modular redundancy systems synthesized into SRAM-based FPGAs is evaluated. In the proposed N-modular technique an original self-adaptive majority voter elects the outputs of the redundant modules. Experimentally evaluated neutron cross-section, area, and power consumption were analyzed for different numbers of redundant modules, ranging from 3 copies (standard TMR) up to 7 copies.",

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AU - Frost, Christopher

AU - Valderrama, Carlos

PY - 2014/8

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KW - Fault tolerance

KW - N-modular redundancy

KW - SRAM-based FPGAs

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Neutron cross-section of N-modular redundancy technique in SRAM-based FPGAs

Abstract

Keywords

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