Skip to main navigation Skip to search Skip to main content

Neutron cross-section of N-modular redundancy technique in SRAM-based FPGAs

  • Jimmy Tarrillo
  • , Fernanda Lima Kastensmidt
  • , Paolo Rech
  • , Christopher Frost
  • , Carlos Valderrama

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

This paper evaluates different trade-offs of N-modular redundancy technique in SRAM-based FPGAs. Redundant copies of the same module were implemented and the outputs voted by self-adapted majority voter. The redundant design was exposed to neutrons and the error rate was evaluated. Results in cross-section, area and power consumption were analyzed for different numbers of redundant modules, ranging from 3 copies (standard TMR) up to 7 copies.

Original languageEnglish
Title of host publicationProceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467350570
DOIs
StatePublished - 28 Oct 2013
Externally publishedYes
Event2013 14th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2013 - Oxford, United Kingdom
Duration: 23 Sep 201327 Sep 2013

Publication series

NameProceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Conference

Conference2013 14th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2013
Country/TerritoryUnited Kingdom
CityOxford
Period23/09/1327/09/13

Keywords

  • Fault tolerance
  • N-modular redundancy
  • SRAM-based FPGAs

Fingerprint

Dive into the research topics of 'Neutron cross-section of N-modular redundancy technique in SRAM-based FPGAs'. Together they form a unique fingerprint.

Cite this