Flexible waveguide coupling probe for wafer-level optical characterization of planar lightwave circuits

Abdullah J. Zakariya, Tao Liu, Julien G. Noel, Roberto R. Panepucci

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

A probe that enables optical coupling to planar lightwave circuits (PLCs) is described. A flexible waveguide is used to form a variable length directional coupler that extracts light from a waveguide in the wafer to the probe. Varying the length enables optimal coupling to be achieved for a wide range of probe-to-waveguide gap, materials, widths and cladding thicknesses present on a chip. In this paper we consider the use of SU-8 polymer as waveguide test probe and polydimethylsiloxane (PDMS) as cladding for the probe. The results indicate that this approach is ideal for characterizing PLC's as the 3dB bandwidth of the probe covers the whole 1300 -1700 nm fiber-optic telecommunication range. Coupling length control in the range of 50-200 mm leads to maximum coupling in excess of 80% for the range of conditions investigated.

Original languageEnglish
Title of host publication2007 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference, IMOC
Pages458-461
Number of pages4
DOIs
StatePublished - 2007
Externally publishedYes
Event2007 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference, IMOC - Salvador, Brazil
Duration: 29 Jan 20071 Nov 2007

Publication series

NameSBMO/IEEE MTT-S International Microwave and Optoelectronics Conference Proceedings

Conference

Conference2007 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference, IMOC
Country/TerritoryBrazil
CitySalvador
Period29/01/071/11/07

Keywords

  • Flexible waveguides
  • Photonics
  • Polymer waveguides
  • Testing

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