TY - GEN
T1 - Evaluation of a new low cost software level fault tolerance technique to cope with soft errors
AU - Tarrillo, J. F.
AU - Lisboa, C. A.
AU - Carro, L.
AU - Argyrides, C.
AU - Pradhan, D. K.
PY - 2010
Y1 - 2010
N2 - Increasing soft error rates make the protection of combinational logic against transient faults in future technologies a major issue for the fault tolerance community. Since not every transient fault leads to an error at application level, software level fault tolerance has been proposed by several authors as a better approach. In this paper, a new software level technique to detect and correct errors due to transient faults is proposed and compared to a classic one, and the costs of detection and correction for both approaches are compared and discussed.
AB - Increasing soft error rates make the protection of combinational logic against transient faults in future technologies a major issue for the fault tolerance community. Since not every transient fault leads to an error at application level, software level fault tolerance has been proposed by several authors as a better approach. In this paper, a new software level technique to detect and correct errors due to transient faults is proposed and compared to a classic one, and the costs of detection and correction for both approaches are compared and discussed.
UR - https://www.scopus.com/pages/publications/77958126059
U2 - 10.1109/LATW.2010.5550371
DO - 10.1109/LATW.2010.5550371
M3 - Conference contribution
AN - SCOPUS:77958126059
SN - 9781424477852
T3 - LATW2010 - 11th Latin-American Test Workshop
BT - LATW2010 - 11th Latin-American Test Workshop
T2 - 11th Latin-American Test Workshop, LATW2010
Y2 - 28 March 2010 through 31 March 2010
ER -