TY - JOUR
T1 - Embedded System for Controlling Temperature, Relative Humidity, and Lighting for a Test Chamber
AU - Benavides, Micaela
AU - Nunovero, Nicolas
AU - Tarrillo, Jimmy
N1 - Publisher Copyright:
© 2009-2012 IEEE.
PY - 2025
Y1 - 2025
N2 - Temperature and humidity chambers are often employed for stress testing materials. In the case of cultural heritage materials, it is also crucial to incorporate light condition in these evaluations. Consequently, controlling these parameters is essential to effectively simulate accelerated environmental conditions. This letter outlines the design and implementation of an embedded system that manages temperature, humidity, and light levels. Built on an ARM Cortex-M3 System on Chip, the system integrates various temperature and humidity sensors and actuators, along with a light controller. It also features an embedded user interface and facilitates communication with an external PC. The validity of our proposal is demonstrated through the implementation of a proportional-integer control mechanism for the regulation of temperature and relative humidity.
AB - Temperature and humidity chambers are often employed for stress testing materials. In the case of cultural heritage materials, it is also crucial to incorporate light condition in these evaluations. Consequently, controlling these parameters is essential to effectively simulate accelerated environmental conditions. This letter outlines the design and implementation of an embedded system that manages temperature, humidity, and light levels. Built on an ARM Cortex-M3 System on Chip, the system integrates various temperature and humidity sensors and actuators, along with a light controller. It also features an embedded user interface and facilitates communication with an external PC. The validity of our proposal is demonstrated through the implementation of a proportional-integer control mechanism for the regulation of temperature and relative humidity.
KW - Embedded Control System
KW - Embedded system
KW - System-on-Chip
KW - Test chamber
UR - http://www.scopus.com/inward/record.url?scp=105007331208&partnerID=8YFLogxK
U2 - 10.1109/LES.2025.3575321
DO - 10.1109/LES.2025.3575321
M3 - Article
AN - SCOPUS:105007331208
SN - 1943-0663
JO - IEEE Embedded Systems Letters
JF - IEEE Embedded Systems Letters
ER -