Abstract
This work analyzes the behavior of a designed embedded system composed of microprocessor, memories and SpaceWire (SpW) links under Total Ionizing Dose (TID) synthesized into a commercial flash-based FPGA from Actel. Two tests were performed: one the FPGA is configured just once at the beginning of the irradiation and the other the FPGA is reconfigured every 5 krad (Si). Results evaluate power supply current (Icc), temperature, function operation and performance degradation.
| Original language | English |
|---|---|
| Article number | 6075302 |
| Pages (from-to) | 2855-2862 |
| Number of pages | 8 |
| Journal | IEEE Transactions on Nuclear Science |
| Volume | 58 |
| Issue number | 6 PART 1 |
| DOIs | |
| State | Published - Dec 2011 |
| Externally published | Yes |
Keywords
- Embedded system
- Flash-based FPGA
- radiation effects
- system on chip
- total ionizing dose
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