Skip to main navigation Skip to search Skip to main content

Analyzing the effects of TID in an embedded system running in a flash-based FPGA

  • Jimmy Tarrillo
  • , José Rodrigo Azambuja
  • , Fernanda Lima Kastensmidt
  • , Evaldo Carlos Pereira Fonseca
  • , Rafael Galhardo
  • , Odair Goncalez

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

This work analyzes the behavior of a designed embedded system composed of microprocessor, memories and SpaceWire (SpW) links under Total Ionizing Dose (TID) synthesized into a commercial flash-based FPGA from Actel. Two tests were performed: one the FPGA is configured just once at the beginning of the irradiation and the other the FPGA is reconfigured every 5 krad (Si). Results evaluate power supply current (Icc), temperature, function operation and performance degradation.

Original languageEnglish
Article number6075302
Pages (from-to)2855-2862
Number of pages8
JournalIEEE Transactions on Nuclear Science
Volume58
Issue number6 PART 1
DOIs
StatePublished - Dec 2011
Externally publishedYes

Keywords

  • Embedded system
  • Flash-based FPGA
  • radiation effects
  • system on chip
  • total ionizing dose

Fingerprint

Dive into the research topics of 'Analyzing the effects of TID in an embedded system running in a flash-based FPGA'. Together they form a unique fingerprint.

Cite this